- Associate Professor, Mechanical Engineering
- Morris E. Foster Faculty Fellow II
- Phone: 979-458-8121
- Email: cblee@tamu.edu
- Office: MEOB 320
- Website: Research Webpage
- Linkedin: Profile

Educational Background
- Postdoctoral research, Mechanical Engineering, University of South Carolina — 2013
- Ph.D., Mechatronics, Gwangju Institute of Science and Technology — 2012
- M.S., Mechatronics, Gwangju Institute of Science and Technology — 2008
- B.S., Mechanical Engineering, Chung-Ang University — 2006
Research Interests
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- Semiconductor metrology and inspection
- Interferometry for length, surface and volume measurements.
- Three-dimensional imaging
- Machine tool metrology
- Dynamic system (mechatronics) metrology and inspection
- Robotic machining processes
- Magnetic/Electric/Optical spectroscopy
Awards & Honors
- 2021 Emerging Leaders, Institute of Physics
- 2020 ASME Blackall Machine Tool and Gage Award
- 2019 Best Alumni Award, GIST
- 2017 Kinslow Research Award (Honorable Mention) at TN Tech
- 2017 American Society for Precision Engineering Best Researcher Award
- 2017 Research and Economic Development Award at TN Tech
Selected Publications
- Pengfei Lin, Kuan Lu, and ChaBum Lee, A Novel Method for Through-Silicon Via Characterization based on Diffraction Fringe Analysis, Ultramicroscopy, 272 114136 (2025)
- Kuan Lu, Byunggi Kim, Masahiro Nomura, Jiyong Park, and ChaBum Lee, Silicon-via (Si-via) Hole Metrology and Inspection by Grayfield Edge Diffractometry, Journal of Manufacturing Processes, 133, pp. 503-509 (2025). https://doi.org/10.1016/j.jmapro.2024.11.086
- Kuan Lu, Pengfei Lin, and ChaBum Lee, A Digital Approach to Via Edge Roughness Characterization and Quantification, International Journal of Precision Engineering and Manufacturing-Smart Technology, 2(2), pp. 93-99 (2024)
- Kuan Lu and ChaBum Lee, Hole Edge Metrology and Inspection by Edge Diffractometry, Journal of Manufacturing Science and Engineering, Vol 146, 070905 (2024).
- Zhikun Wang, Pengfei Lin, Phuc Nguyen, Jingyan Wang, and ChaBum Lee, Characterization of Photomask Patterns and Lithography-printed Patterns, Precision Engineering, 88, pp. 235-240 (2024) https://doi.org/10.1016/j.precisioneng.2024.02.006