• Professor of Practice
Aakash Tyagi

Educational Background

  • Ph.D. Computer Engineering, University of Louisiana, Lafayette, Louisiana, 1993
  • M.S. Electrical and Computer Engineering, University of Louisiana, Lafayette, Louisiana, 1989
  • B.S. Electronics & Communication, Kamla Nehru Institute of Technology, Sultanpur, India, 1987

Research Interests

  • High Performance Computing Architectures and Applications

    Teaching Interests

    Computer Architecture, Hardware Verification, Project Management

    Industry Experience

    • 20 years of service at Intel in positions ranging from individual technical contributor to Senior Director in Server Development Group.

    • Worked on 8 generations of CPU’s at Intel; most recently managed the Design and Execution of Knights Landing: 2015 2nd Generation Xeon Phi Product

    • Project Management at Intel Corporation in Processor Design

Awards & Honors

  • 32 Intel Department and Division awards for individual and team achievements, 1995.
  • Repeat annual recognition in Top-800 Leaders in Intel Corporation, 2010-2013.
  • CSE Undergraduate Faculty Teaching Excellence Award, TAMU-Department, 2015.
  • TAMU Professor of Practice Instructional Grant Award, 2015.
  • College of Engineering Instructional Faculty Teaching Award, TAMU College of Engineering, 2016.
  • CSE Undergraduate Faculty Teaching Excellence Award, TAMU-Department, 2017.

Selected Publications

  • A. Tyagi and M.A. Bayoumi, “Image Segmentation on a 2D Array by a Directed Split and Merge Procedure,” IEEE Transactions on Signal Processing, Vol. 40, No. 2, November 1992, pp 2804- 2813.
  • A. Tyagi and M.A. Bayoumi, “Defect Clustering Viewed Through Generalized Poisson Distribution,” IEEE Transactions on Semiconductor Manufacturing, Vol. 5, No. 3, August 1992, pp. 196-206.
  • M.K. Kidambi, A. Tyagi, M.R. Madani, and M.A. Bayoumi, "Three-Dimensional Defect Sensitivity Modeling for Open Circuits in ULSI Structures," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 17, No. 4, April 1998, pp. 366-371.
  • A. Tyagi and M.A. Bayoumi, “The Nature of Defect Patterns on Integrated-Circuit Wafer Maps,” IEEE Transactions on Reliability, March 1994, pp. 22-29.
  • S. Popli, M.A. Bayoumi and A. Tyagi, “A Reconfigurable Technique for Reliable VLSI DSP Array Processors,“ Journal of Circuits, Systems, and Computers, Vol. 4, No. 3, March 1992, pp. 281- 304.