Aakash Tyagi

Professor of Practice

Aakash Tyagi Fall 2017

Office: 515A HRBB
Phone: 979.845.5480
Email: tyagi@cse.tamu.edu

Research Interests

High Performance Computing Architectures and Applications

Teaching Interests

Computer Architecture, Hardware Verification, Project Management

Industry Experience

20 years of service at Intel in positions ranging from individual technical contributor to Senior Director in Server Development Group. Worked on 8 generations of CPU’s at Intel; most recently managed the Design and Execution of Knights Landing: 2015 2nd Generation Xeon Phi Product

Awards & Honors

  • 32 Intel Department and Division awards for individual and team achievements, 1995.
  • Repeat annual recognition in Top-800 Leaders in Intel Corporation, 2010-2013.
  • CSE Undergraduate Faculty Teaching Excellence Award, TAMU-Department, 2015.
  • TAMU Professor of Practice Instructional Grant Award, 2015.
  • College of Engineering Instructional Faculty Teaching Award, TAMU College of Engineering, 2016.
  • CSE Undergraduate Faculty Teaching Excellence Award, TAMU-Department, 2017.

Education

  • Ph.D. Computer Engineering, University of Louisiana, Lafayette, Louisiana, 1993
  • M.S. Electrical and Computer Engineering, University of Louisiana, Lafayette, Louisiana, 1989
  • B.S. Electronics & Communication, Kamla Nehru Institute of Technology, Sultanpur, India, 1987

Selected Publications

A. Tyagi and M.A. Bayoumi, “Image Segmentation on a 2D Array by a Directed Split and Merge Procedure,” IEEE Transactions on Signal Processing, Vol. 40, No. 2, November 1992, pp 2804- 2813.

A. Tyagi and M.A. Bayoumi, “Defect Clustering Viewed Through Generalized Poisson Distribution,” IEEE Transactions on Semiconductor Manufacturing, Vol. 5, No. 3, August 1992, pp. 196-206.

M.K. Kidambi, A. Tyagi, M.R. Madani, and M.A. Bayoumi, "Three-Dimensional Defect Sensitivity Modeling for Open Circuits in ULSI Structures," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 17, No. 4, April 1998, pp. 366-371.

A. Tyagi and M.A. Bayoumi, “The Nature of Defect Patterns on Integrated-Circuit Wafer Maps,” IEEE Transactions on Reliability, March 1994, pp. 22-29.

S. Popli, M.A. Bayoumi and A. Tyagi, “A Reconfigurable Technique for Reliable VLSI DSP Array Processors,“ Journal of Circuits, Systems, and Computers, Vol. 4, No. 3, March 1992, pp. 281- 304.